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Electroreflectance study of ordered Ga0.5In0.5P alloys grown on GaAs by organometallic vapor phase epitaxy
58
Citations
10
References
1988
Year
Materials ScienceMaterials EngineeringIi-vi SemiconductorElectroreflectance SpectraEngineeringPhysicsCrystal Growth TechnologyElectroreflectance StudyApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialLiquid Phase EpitaxyMolecular Beam EpitaxyEpitaxial GrowthOrdered Ga0.5in0.5pCompound SemiconductorMicrostructure
We have measured the electroreflectance spectra of ordered Ga0.5In0.5P alloys grown on GaAs by organometallic vapor phase epitaxy. As a result, it has been found that there exist anomalous structures in the region of the E0 and E1 band edges of this material. These anomalous structures are closely related to the recently reported ordered phase in this alloy, since these structures have never been observed with disordered Ga0.5In0.5P alloys such as bulk crystals and epitaxial layers grown by liquid phase epitaxy.
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