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Modelling and simulation challenges for nanoscale MOSFETs in the ballistic limit

Device ModelingBallistic LimitElectrical EngineeringSimulation ChallengesEngineeringSemiconductor DeviceNanoelectronicsNanotechnologyBias Temperature InstabilityNumerical SimulationApplied PhysicsNanoscale MosfetsNanoscale ModelingMicroelectronicsCircuit SimulationMultiscale Modeling