Publication | Closed Access
Atomic Resolution Imaging of the (001) Surface of UHV Cleaved MgO by Dynamic Scanning Force Microscopy
154
Citations
25
References
2003
Year
Dynamic ModePoint DefectsEngineeringMicroscopyUhv Cleaved MgoSingle Mgo CrystalsSurface ReconstructionMaterials ScienceAtomic Resolution ImagingPhysicsCrystal MaterialMicroanalysisDefect FormationCrystallographyMicrostructureMetallographyScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyMagnesium-based Composite
The (001) surface of UHV cleaved single MgO crystals was imaged with dynamic mode scanning force microscopy. Large-scale images show various defects, like steps of mostly one atomic height, rectangular holes of nanometer size, and some complex adstructures. First time images with atomic resolution show one square ionic sublattice in its bulklike dimension with a corrugation of up to 40 pm along the <001> direction. Most images exhibit atomic point defects which appear as depressions including a few ionic lattice sites proving that point defects are stable on flat terraces.
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