X-ray interferometry

Abstract

Due to the efforts of crystal growers in the semiconductor industry, large, almost perfect crystals have become freely available. As a direct result, the construction of many new X-ray optical devices, which use several successive Bragg reflections in different parts of the same crystal block, have become feasible. Although first realized only four years ago (Bonse and Hart 1965a), one such device, an X-ray interferometer working in transmission, has already found applications in the absolute measurement of lattice parameters, small strains and X-ray scattering factors.