Measurement of Lifetime of Carriers in Semiconductors through Microwave Reflection

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation S. Deb, B. R. Nag; Measurement of Lifetime of Carriers in Semiconductors through Microwave Reflection. Journal of Applied Physics 1 April 1962; 33 (4): 1604. https://doi.org/10.1063/1.1728779 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioJournal of Applied Physics Search Advanced Search |Citation Search