SIMS depth profile analysis using MCs+ molecular ions

Secondary Ion Mass Spectrometry

Analytica Chimica Acta · 1993 · 1.1K citations

Natural Sciences, Chemistry, Materials Science +16

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

H. A. Storms, Kenneth F. Brown, John D. Stein · Analytical Chemistry · 1977 · 347 citations

Natural Sciences, Chemistry, Analytical Chemistry +11

A new secondary ion mass spectrometry technique for III-V semiconductor compounds using the molecular ions CsM+

Yijie Gao · Journal of Applied Physics · 1988 · 282 citations

Natural Sciences, Chemistry, Materials Science +16

Mass spectrometry of neutral molecules sputtered from polycrystalline metals by Ar+-ions of 100?1000 eV

W. Gerhard, H. Oechsner · The European Physical Journal B · 1975 · 91 citations

Natural Sciences, Chemistry, Materials Science +8

Secondary Ion Mass Spectrometry—SIMS VII

Analytical Chemistry · 1989 · 87 citations

Natural Sciences, Chemistry, Analytical Chemistry +7