Applied Physics Express · 2008 · 399 citations · 14 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesPhotodetectorsPhotovoltaic DevicesSolar CellsSpectral SensitivityThin Film Optical PropertiesUltraviolet DetectorsAnnealingInternal Quantum EfficiencyPhotodetectionSchottky PhotodetectorsSolar-blind DetectorsThermal AnnealingUltraviolet PhotodetectorsVacuum Evaporation
A vertical-type Schottky photodetector based on a (100)-oriented β-Ga2O3 substrate has been fabricated with simple processes of thermal annealing and vacuum evaporation. The photodetector exhibited a rectification ratio higher than 106 at ±3 V, and showed deep-ultraviolet-light detection at reverse bias. The spectral response showed solar-blind sensitivity with high photoresponsivities of 2.6–8.7 A/W at wavelengths of 200–260 nm. These values were 35–150 times higher than those derived assuming the internal quantum efficiency to be unity. This fact is attributed to the carrier multiplication occurring in the highly resistive surface region that is subject to a high internal electric field of about 1.0 MV/cm at the reverse bias of 10 V.
14
Semiconductor ultraviolet detectors
Manijeh Razeghi, Antoni Rogalski · Journal of Applied Physics · 1996 · 1.5K citations
Deep-ultraviolet transparent conductive β-Ga2O3 thin films
Masahiro Orita, Hiromichi Ohta, Masahiro Hirano et al. · Applied Physics Letters · 2000 · 996 citations
Natural Sciences, Materials Engineering, Materials Science +17
Takayoshi Oshima, Takeya Okuno, Shizυo Fujita · Japanese Journal of Applied Physics · 2007 · 558 citations