Publication | Closed Access
A Practical Method for the Analysis of Overlapped Peaks in Energy Dispersive X-Ray Spectra
39
Citations
11
References
1996
Year
X-ray SpectroscopyNuclear PhysicsEngineeringChemistryX-ray FluorescenceX-ray ImagingX-ray TechnologyPeak DoubletOverlapped PeaksPhysicsAtomic PhysicsQuantum ChemistrySynchrotron RadiationX-ray Free-electron LaserOverlapped Peak SystemsNatural SciencesSpectroscopyX-ray DiffractionApplied PhysicsSpectral AnalysisPractical MethodX-ray Optic
ABSTRACT In this study a practical method for the spectral analysis of some overlapped characteristic X-ray peaks is presented. The overlapped characteristic K, and K, peaks and the artificially overlapped two K, peaks (peak doublet) of arsenic obtained by the radioisotope-excited, energy dispersive X-ray fluorescence (EDXRF) technique, are resolved. A total of 34 overlapped peak systems were investigated: the proposed method provided 18 reliable results, whereas the first and the second methods gave 15 and 1, respectively. The intensity ratios of Kβ/Kα, obtained by the novel method are also in good agreement with the theoretical relativistic Hartree-Slater values.
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