Structure and coherence of NbAl multilayer films

D. B. McWhan, M. Gurvitch, J. M. Rowell, L. R. Walker

Journal of Applied Physics · 1983 · 101 citations · 11 references

Concepts

Abstract

NbnAlm multilayer films grown on oxidized Si(100) at room temperature by magnetron sputtering have Nb[110] and A[111] texture. The films have ∼1% coherency strains which decrease with increasing modulation wavelength. The composition modulation is approximately a trapezoidal wave with interfacial regions ∼11 Å thick as a result of grain boundary diffusion.

References

11