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Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements

Materials ScienceEngineeringOxide ElectronicsSurface ScienceApplied PhysicsStructural AnalysisNio Ultra-thin FilmsGallium OxideThin FilmsMolecular Beam EpitaxyEpitaxial GrowthUltra-smooth Sapphire SubstratesCrystallographyThin Film Processing