Optical properties of CuIn5Se8 and CuGa5Se8 from ellipsometric measurements

Materials Research Society

Rustum Roy, H. J. Leamy, C. W. White et al. · Physics Today · 1984 · 1K citations

Engineering, Material Selection, Bibliometrics +19

Interband critical points of GaAs and their temperature dependence

P. Lautenschlager, M. Garriga, S. Logothetidis et al. · Physical review. B, Condensed matter · 1987 · 841 citations

Engineering, Electronic Structure, Spectroscopic Property +16

Fitting refractive-index data with the Sellmeier dispersion formula

Berge Tatian · Applied Optics · 1984 · 348 citations

Optical Materials, Engineering, Measurement +16

Temperature dependence of the interband critical-point parameters of InP

P. Lautenschlager, M. Garriga, M. Cardona · Physical review. B, Condensed matter · 1987 · 230 citations

Optical Materials, Engineering, Temperature Dependence +16

Spectroscopic ellipsometry: a historical overview

K. Vedam · Thin Solid Films · 1998 · 187 citations

Photometry, Engineering, Optical Properties +4