Giant Metal Compression at Liquid-Solid (Pb-Si, In-Si) Schottky Junctions

Abstract

Using a high-energy x-ray transmission-reflection scheme we have studied the density profile of solid-liquid Schottky contacts close to the interface. We found a massive disturbance of the electronic system on the liquid metal side at different interfaces with pronounced density anomalies on a new length scale. The liquid metal at the interface forms a strongly compressed layer followed by a density depleted layer. The experimental evidence points to a charge transfer phenomenon in the metallic system. Control experiments performed at a metal-insulator interface confirm this picture.