Comparison of the surface morphology and microstructure of in situ and ex situ derived YBa2Cu3O7−x thin films

A. C. Westerheim, Paul C. McIntyre, Soumendra N. Basu, Deepa Bhatt, L.S. Yu-Jahnes, Alfredo C. Anderson, Michael J. Cima

Journal of Electronic Materials · 1993 · 13 citations · 20 references

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