Japanese Journal of Applied Physics · 1989 · 14 citations · 5 references
Materials ScienceEngineeringCrystalline DefectsTransmission Electron MicroscopyOxide ElectronicsCubic Boron NitrideApplied PhysicsCondensed Matter PhysicsMoo 4Amorphous MetalCrystalline FilmsThin FilmsThin Film Process TechnologyAmorphous SolidThin Film ProcessingElectrochemistry
The structure of amorphous and crystalline electroless Ni–Mo–B films was studied by transmission electron microscopy (TEM). The amorphous film in as-deposited conditions was of a completely disordered state with few crystalline regions. This film crystallized by means of nucleation after 300°C annealing; the produced nuclei grew large after 500°C annealing. Two crystalline films in the as-deposited state, plated from 0.005 and 0.010 mol dm -3 Na 2 MoO 4 concentration baths, showed different annealing behavior even though they had almost identical Ni and Mo composition. The former contained amorphous-like regions corresponding to an intermediate state between the amorphous and the crystalline. The latter film was so stable against annealing that the structure of small grains was maintained after 500°C annealing.
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