Measurements with a 35-psec gate time microchannel plate camera

P. M. Bell, J. D. Kilkenny, R. L. Hanks, O. L. Landen

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1991 · 40 citations · 0 references

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Abstract

Measurements of the x-ray gate time of 0. 2 mm thick microchannel plates with an LID aspect ratio of 20 as opposed to the more usual L/D demonstrate that gate times of 35 PS can be achieved. Good agreement with time dependent modelling is demonstrated L