Publication | Closed Access
X-ray diffraction evidence of adatoms in the Si(111)7×7 reconstructed surface
83
Citations
16
References
1986
Year
EngineeringElectron DiffractionSilicon On InsulatorOptical PropertiesX-ray Diffraction EvidenceDiamond LatticeSurface ReconstructionMaterials SciencePhysicsAtomic PhysicsDefect FormationSynchrotron RadiationCrystallographySurface CharacterizationDiamond-like CarbonSurface AnalysisSurface ScienceApplied PhysicsCondensed Matter PhysicsStacking Fault
Synchrotron radiation has been employed to measure 73 fractional-order surface Bragg reflections from Si(111)7\ifmmode\times\else\texttimes\fi{}7. A novel data-filtering technique is introduced to address the question of which sites in the diamond lattice are filled and which are vacant at the surface. The analysis is greatly simplified because atomic displacements are systematically nulled. Our observations agree with the principle of a ``stacking fault'' under half the unit cell. Difference analysis then requires 12 adatoms and one vacancy to complete the structure.
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