Concepedia

A comparison of absolute yields of excited neutrals and positive ions from ion-bombarded surfaces

Peter Williams, I. S. T. Tsong, S. Tsuji

Nuclear Instruments and Methods · 1980 · 33 citations · 9 references

DOI

Concepts

References

9

Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets

Peter Sigmund · Physical Review · 1969 · 3.5K citations

, , +13

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

, , +14

The sputtering process and sputtered ion emission

Peter Williams · Surface Science · 1979 · 332 citations

, , +8

Adsorption of gases studied by secondary ion emission mass spectrometry

G. Blaise, M. Bernheim · Surface Science · 1975 · 118 citations

, , +12

Similarities in photon and ion emissions induced by sputtering

G. Blaise · Surface Science · 1976 · 73 citations

, , +9