Publication | Closed Access
Optimal replacement of damaged devices
41
Citations
6
References
1978
Year
ReliabilityHardware SecurityOptimal Replacement PolicyReliability EngineeringEngineeringRisk ManagementParameter λComputer EngineeringSystems EngineeringReplacement ProcedureProbability TheoryElectronic PackagingOptimal ReplacementMicroelectronicsAccumulated DamagePhysic Of FailureDevice ReliabilityOperations Research
A device is subject to a sequence of shocks occurring randomly at times n = 1, 2, ⃛. At each point in time, shocks occur according to a Poisson distribution with parameter λ . Shocks cause damage and damage accumulates additively. They can cause the device to fail, and the probability of such a failure depends on the accumulated damage. Failure occurs because of shocks and can occur only at times n = 1, 2, ⃛. The device can be replaced before or at failure. If the device fails it is immediately replaced at a fixed cost. Replacement before failure can only occur at times n = 1, 2, ⃛, and is done at a lower cost depending on the amount of accumulated damage at replacement. In this paper we determine the optimal replacement policy that minimizes the expected cost per unit time.
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