Applied Physics Letters · 1988 · 146 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceElectromagnetismMagnetic MaterialsThin FilmsAtomic Force MicroscopyMagnetic CharacterizationMagnetic Recording MaterialsMagnetic Thin FilmsMagnetization ProcessesThin Film Magnetic PropertiesContrastLongitudinal Magnetic Recording MediaMagnetic Force MicroscopyMagnetic MicroscopyMagnetic RecordingMagnetic Recording MediaMagnetization MeasurementMicroscope Imaging
A force microscope with a magnetic tip has been used to examine magnetization patterns in a thin-film cobalt-alloy sample similar to that used in magnetic disk recording. Longitudinal magnetic bits were written on discrete tracks with a recording head flown over the surface of the sample. After minimal sample preparation, images were obtained showing strong magnetic contrast. Model calculations for the expected image contrast were found to be in excellent qualitative agreement with experimental results. By using a constant height imaging mode, enhanced contrast for fine detail was obtained.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution
Y. Martin, H. K. Wickramasinghe · Applied Physics Letters · 1987 · 1.1K citations
Observation of magnetic forces by the atomic force microscope
J. J. Sáenz, Nicolás García, Peter Grütter et al. · Journal of Applied Physics · 1987 · 353 citations