Impact of intrinsic parameter fluctuations in decanano MOSFETs on yield and functionality of SRAM cells - Concepedia

Concepedia

Publication | Closed Access

Impact of intrinsic parameter fluctuations in decanano MOSFETs on yield and functionality of SRAM cells

90

Citations

5

References

2005

Year

B. Cheng, S. Roy, G. Roy, Fikru Adamu-Lema, A. Asenov

Solid-State Electronics

Sram CellsElectrical EngineeringEngineeringPhysicsNanoelectronicsBias Temperature InstabilitySemiconductor MemoryIntrinsic Parameter FluctuationsDecanano MosfetsMicroelectronicsSemiconductor Device

References

	Year	Citations

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