Worst case analysis of linear analog circuit performance based on Kharitonov's rectangle

Abstract

In the spirit of Kharitonov's rectangle, an efficient worst case analysis approach for linear analog circuit performance under process variations is proposed in this paper. By contrast with the Monte Carlo method, the proposed approach strongly reduces the computation to only evaluate a few of Kharitonov-type critical transfer functions, whose envelop will give the worst case variation range of performance metrics. The computational efficiency of the method suggested is demonstrated by a real analog circuit example.