Theory of transient emission current in MOS devices and the direct determination interface trap parameters - Concepedia

Concepedia

Publication | Closed Access

Theory of transient emission current in MOS devices and the direct determination interface trap parameters

86

Citations

11

References

1974

Year

J.G. Simmons, Linfeng Wei

Solid-State Electronics

Device ModelingElectrical EngineeringMos DevicesEngineeringNanoelectronicsElectronic EngineeringTransient EmissionApplied PhysicsBias Temperature InstabilityInstrumentationMicroelectronicsSemiconductor Device

References

	Year	Citations

Page 1