IEEE Transactions on Electromagnetic Compatibility · 2011 · 61 citations · 19 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSurface EngineeringThin FilmsDielectricsInterconnect TechnologySurface RoughnessSurface Roughness EffectsTransmission LinesConductor LossDielectric LossesDielectric MeasurementLine RoughnessLossy Transmission LinesScanning Electron MicroscopySurface Roughness ParametersThin Film Surface Roughness
Copper foil in printed circuit board (PCB) transmission lines/interconnects is roughened to promote adhesion to dielectric substrates. It is important to characterize PCB substrate dielectrics and correctly separate dielectric and conductor losses, especially as data rates in high-speed digital designs increase. Herein, a differential method is proposed for separating conductor and dielectric losses in PCBs with rough conductors. This approach requires at least three transmission lines with identical, or at least as close as technologically possible, basic geometry parameters of signal trace, distance-to-ground planes, and dielectric properties, while the average peak-to-valley amplitude of surface roughness of the conductor would be different. The peak-to-valley amplitude of conductor roughness is determined from scanning electron microscopy images.
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Journal of the Franklin Institute · 1963 · 5.8K citations
Advances in atomic force microscopy
Franz J. Gießibl · Reviews of Modern Physics · 2003 · 2.2K citations · Full text