Directional x-ray dark-field imaging

Abstract

We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.