ToF-SIMS measurements with topographic information in combined images

Protocols for Three-Dimensional Molecular Imaging Using Mass Spectrometry

A. Wucher, Juan Cheng, Nicholas Winograd · Analytical Chemistry · 2007 · 111 citations

Engineering, Microscopy, Electron Microscopy +20

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with<i>In Situ</i>AFM

J. A. Whitby, Fredrik Östlund, Péter Horváth et al. · Advances in Materials Science and Engineering · 2011 · 81 citations · Full text

Microscopy, Biological Mass Spectrometry, Ion Beam Instrumentation +17

Topography in secondary ion mass spectroscopy images

Srinath Rangarajan, Bonnie J. Tyler · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2006 · 48 citations

Ion Peaks, Analytical Instrumentation, Microscopy +14

Combined SIMS‐SPM instrument for high sensitivity and high‐resolution elemental 3D analysis

Tom Wirtz, Y.H. Fleming, Urs Gysin et al. · Surface and Interface Analysis · 2012 · 31 citations

Topographic Correction of 3D SIMS Images

M. L. Wagter, A. H. Clarke, Keith F. Taylor et al. · Surface and Interface Analysis · 1997 · 26 citations

Engineering, Microscopy, Computer-aided Design +20