Philosophical magazine · 1975 · 47 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSurface ScienceThin FilmsThin Film AnnealingThin Film NucleationThin Film Surface MorphologyThin-film MaterialsAmorphous CarbonAmorphous Thin FilmsAnnealing EffectsAnnealing Temperature EffectsCrystallographic Preferred OrientationPreferred OrientationRandom Network ModelsThin-film Morphology
Abstract Dark-field pictures of a thin carbon film deposited at room temperature and of a film annealed at 1050°C have been compared and suggest totally different structures for these two carbons. Pictures of the film deposited at room temperature correspond to what is expected from a tetrahedral random network model. Pictures of the annealed films correspond to turbostratic stacks of aromatic carbon layers. These annealed films show a preferred orientation of the layers, parallel to the film surface. This anisotropy is induced by the solid-vacuum interface of the thin carbon film, as nucleation of aromatic molecules by annealing takes place.
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Electron diffraction study of evaporated carbon films
Jiro Kakinoki, Y. Komura, Tadashi Ino · Acta Crystallographica · 1960 · 184 citations
The structure of amorphous Si and Ge
M. L. Rudee, A. Howie · Philosophical magazine · 1972 · 141 citations