Kikuchi-like reflection patterns obtained with the scanning electron microscope

Abstract

Abstract Orientation-dependant patterns, very similar in appearance to Kikuchi patterns, have been obtained using thick single-crystal specimens in a scanning electron microscope. The patterns are superimposed on the normal topographical image and are obtained with both the back-scattered-electron and specimen current modes of operation. The width of the Kikuchi-like bands is proportional to the wavelength of the incident electrons, and depends also on the angle through which the electron beam is scanned.