Concepedia

Measurements of relative secondary ion yields from oxidized tungsten (100) under bombardment by ions with different masses and energies

A. Benninghoven, C. Plog, N. Treitz

International Journal of Mass Spectrometry and Ion Physics · 1974 · 36 citations · 10 references

DOI

Concepts

References

10

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

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Analysis of Submonolayers on Silver by Negative Secondary Ion Emission

A. Benninghoven · physica status solidi (b) · 1969 · 107 citations

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A High Efficiency Ion Source

A. Theodore Finkelstein · Review of Scientific Instruments · 1940 · 80 citations

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Tandem Mass Spectrometer for Secondary Ion Studies

A. Benninghoven, E. Loebach · Review of Scientific Instruments · 1971 · 74 citations

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SECONDARY ION EMISSION

Ya.M. Fogel · Soviet Physics Uspekhi · 1967 · 50 citations