Japanese Journal of Applied Physics · 1966 · 47 citations · 3 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsSolid State PhysicsCrystallographyElectron DiffractionStates Of MatterThin Film Electrical PropertiesElectrical Resistance MeasurementElectron Diffraction Of Thin FilmsLow-temperature CrystallographyLow-temperature MaterialsPreliminary InvestigationSpecimen Temperature ControlTemperature-dependent Diffraction
An electron diffraction apparatus has been constructed for studies at low temperature down to 4.2°K. In this apparatus, a specimen holder is attached to a bottom of a small cryostat, into which liquid helium is poured from a storage vessel through a transfer tube. The specimen temperature is controlled mainly by adjusting the flowing quantity of liquid helium and sometimes by the operations of a small electrical heater. The construction and characteristics of the apparatus are presented. Preliminary results on bismuth, gallium, Pb-12%Bi and beryllium films prepared by the low temperature condensation are also described. The present results on bismuth and gallium are different in some respects from those of a previous researcher. Correspondence between change of a state of atomic aggregate and anomalies of electrical resistance are confirmed in the cases of Pb-12%Bi and beryllium films prepared by low temperature condensation.
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Electron diffraction studies on solid α-nitrogen
E. M. Hörl, L. Marton · Acta Crystallographica · 1961 · 50 citations · Full text