Maximum likelihood method for calibration of Mueller polarimeters in reflection configuration

Abstract

We address calibration of Mueller polarimeters in the presence of noise. We compare an extension of the eigenvalue calibration method (ECM) and a maximum likelihood (ML) method. The performances of these two calibration methods are investigated with numerical simulations and real experiments on a broadband infrared polarimeter. It is found that the ML method is superior to the extended ECM in terms of calibration precision and can be used at lower signal-to-noise ratio.