Conoscopic interferometry of surface-acoustic-wave substrate crystals

Abstract

Conoscopic interferometry is applied for determining the crystal orientation of lithium niobate and other commonly employed substrate wafers for integrated-optic and surface-acoustic-wave devices. The method is particularly applicable for detecting the orientation of the optic axes of the strongly birefringent niobate but is less sensitive for lithium tantalate or quartz. Conoscopic interference is a low-cost and easy-to-use method that is especially suitable for laboratory usage.