Publication | Closed Access
New Phenomenon in the Absorption of Oxygen on Silicon
32
Citations
11
References
1978
Year
Surface CharacterizationEngineeringSurface ChemistryNew PhenomenonSurface AnalysisSurface ScienceApplied PhysicsCondensed Matter PhysicsChemical ShiftChemisorptionEv SiPhysical ChemistryVacuum DeviceChemistrySilicon On InsulatorAdsorption StateSurface Reactivity
An ${\mathrm{O}}_{2}$ adsorption state on the Si(111) 2\ifmmode\times\else\texttimes\fi{}1 surface has been found which will remove surface states without producing a chemical shift of the Si $2p$ core level, suggesting a strongly covalent bond. This is accomplished by using an initial exposure pressure of ${10}^{\ensuremath{-}8}$ Torr. Exposures using an initial exposure pressure of ${10}^{\ensuremath{-}6}$ Torr also remove the surface states but produce a 2.0 eV Si $2p$ chemical shift indicating an ionic bond different from that of Si${\mathrm{O}}_{2}$ (shift of 3.8 eV).
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