Applied Surface Science · 2006 · 31 citations · 21 references
Materials ScienceSinteringEngineeringApplied PhysicsThin Film Process TechnologyThin FilmsThin Film Processing
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Band gap determination in thick films from reflectance measurements
Vipin Kumar, Sachin Sharma, T.P. Sharma et al. · Optical Materials · 1999 · 262 citations
G. F. Neumark, Robert M. Park, J. M. DePuydt · Physics Today · 1994 · 101 citations