Characterizing deformed ultrafine-grained and nanocrystalline materials using transmission Kikuchi diffraction in a scanning electron microscope

Patrick Trimby, Zibin Chen, Shuang Han, Kevin J. Hemker, Jianshe Lian, Xiaozhou Liao, Paul F. Rottmann, S.K. Samudrala, Jingli Sun, Jing Tao Wang,

Acta Materialia · 2013 · 160 citations · 36 references

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