Acta Materialia · 2013 · 160 citations · 36 references
Materials ScienceNanocrystalline MaterialsEngineeringElectron MicroscopyMicroscopyNanotechnologyScanning Probe MicroscopyApplied PhysicsMicroanalysisElectron MicroscopeElectron DiffractionScanning Electron MicroscopeTransmission Kikuchi DiffractionMicrostructure
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K.S. Kumar, H. Van Swygenhoven, S. Suresh · Acta Materialia · 2003 · 1.9K citations
The quantitative analysis of thin specimens
G. Cliff, G. W. Lorimer · Journal of Microscopy · 1975 · 1.8K citations