Publication | Open Access
Measuring electrical current during scanning probe oxidation
37
Citations
12
References
2003
Year
Materials ScienceElectrical EngineeringEngineeringMeasurementMicroscopyCurrent AcquisitionSurface ScienceApplied PhysicsScanning Probe MicroscopyEducationOxide GrowthElectroanalytical SensorInstrumentationElectronic InstrumentationProbe OxidationElectrode Reaction MechanismElectrochemistryElectrical Insulation
Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip–surface distance is known unequivocally during current acquisition. Current measurements at finite tip–sample distance, in particular, unveil how the geometry of the meniscus influences its electrical conduction properties as well as the role of space charge at very small tip–sample distances.
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