XAFS and TOF–SIMS analysis of SEI layers on electrodes - Concepedia

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XAFS and TOF–SIMS analysis of SEI layers on electrodes

178

Citations

18

References

2003

Year

Hitoshi Ota, Toshio Akai, H. Namita, Shoji Yamaguchi, Masaharu Nomura

Journal of Power Sources

Electrical EngineeringEngineeringApplied PhysicsElectrochemical InterfaceElectrophysiologySei LayersElectrode Reaction MechanismElectrochemistry

References

	Year	Citations

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