Description of the influence of charging on the measurement of the secondary electron yield of MgO - Concepedia

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Description of the influence of charging on the measurement of the secondary electron yield of MgO

42

Citations

9

References

1997

Year

Jakub Scholtz, R. Schmitz, B.H.W. Hendriks, S.T. de Zwart

Applied Surface Science

Electrical EngineeringEngineeringElectron SpectroscopySecondary Electron YieldElectrochemistry

References

	Year	Citations

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