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Characterization of Cd implanted and annealed GaAs and InP by perturbed angular correlation (PAC) spectroscopy

DOI

10

Citations

5

References

1991

Year

Walter Pfeiffer, M. Deicher, R. Keller, R. Magerle, P. Pross, H. Skudlik, Th. Wichert, H. Wolf, D. Forkel, N. Moriya,
Applied Surface Science

References

YearCitations

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