Indium-defect complexes in silicon studied by perturbed angular correlation spectroscopy

Th. Wichert, M. Deicher, G. Gr�bel, +3

Applied Physics A

EngineeringApplied PhysicsCondensed Matter PhysicsSiliceneDefect Formation +5

Passivation of shallow acceptors by H in Si: A microscopic study by perturbed angular correlations

Th. Wichert, H. Skudlik, M. Deicher, +4

Physical Review Letters

EngineeringAcceptor-hydrogen ComplexesChemistrySilicon On InsulatorAcceptor Atoms +18

Copper in silicon

R. Keller, M. Deicher, Walter Pfeiffer, +3

Physical Review Letters

EngineeringChemistrySilicon On InsulatorDissociation EnergySemiconductors +16

Cd-H pairs in GaAs: Identification and stability

Walter Pfeiffer, M. Deicher, R. Keller, +8

Applied Physics Letters

Annealing of Cd-implanted GaAs: Defect removal, lattice site occupation, and electrical activation

N. Moriya, Igal Brener, R. Kalish, +8

Journal of Applied Physics

Cd ImplantIi-vi SemiconductorElectrical EngineeringIon ImplantationEngineering +13

H passivation of shallow acceptors in Si studied by use of the perturbed-γγ-angular-correlation technique

H. Skudlik, M. Deicher, R. Keller, +5

Physical review. B, Condensed matter

Semiconductor TechnologySemiconductor DeviceH PassivationNuclear PhysicsPhysics +13

Structural lattice defects in silicon observed at111in by perturbed angular correlation

M. Deicher, G. Grübel, E. Recknagel, +2

Hyperfine Interactions

Materials ScienceEngineeringPhysicsCondensed Matter PhysicsSilicene +8

Defects in CdS: In detected by perturbed angular correlation spectroscopy (PAC)

R. Magerle, M. Deicher, U.V. Desnica, +5

Applied Surface Science

Ii-vi SemiconductorEngineeringCrystalline DefectsPhysicsNatural Sciences +6

Investigation of hydrogen in semiconductors by nuclear techniques

M. Deicher, R. Keller, Walter Pfeiffer, +2

Physica B Condensed Matter

SemiconductorsEngineeringNuclear TechniquesApplied PhysicsHydrogen Utilization +1

Characterization of Cd implanted and annealed GaAs and InP by perturbed angular correlation (PAC) spectroscopy

Walter Pfeiffer, M. Deicher, R. Keller, +8

Applied Surface Science

Ii-vi SemiconductorElectrical EngineeringEngineeringPhysicsOptical Properties +4