Beam deflection measurement of time and polarization resolved ultrafast nonlinear refraction

Manuel R. Ferdinandus, Honghua Hu, Matthew Reichert, David J. Hagan, Eric W. Van Stryland

Optics Letters · 2013 · 80 citations · 17 references

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Concepts

Abstract

We modify the well-known photothermal beam deflection technique to study ultrafast nonlinearities. Using phase-sensitive detection we directly measure the temporal and polarization dynamics of nonlinear refraction (NLR) with sensitivity to optically induced phase changes of approximately λ/20,000. We use the relative polarization dependence of excitation and probe to separate the isotropic and reorientational components of the NLR.

References

17