Concepedia

X-ray and electron microscopy studies of single-layer TaS2 and NbS2

C. Liu, O. Singh, P. Joensen, A.E. Curzon, R. F. Frindt

Thin Solid Films · 1984 · 45 citations · 5 references

DOI

Concepts

References

5

New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance

K. von Klitzing, G. Dorda, M. Pepper · Physical Review Letters · 1980 · 7K citations · Full text

, , +17

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials.

A. L. Patterson · Journal of the American Chemical Society · 1955 · 2.8K citations

, , +11

X-Ray Diffraction in Random Layer Lattices

Β. E. Warren · Physical Review · 1941 · 1.3K citations

, , +16

The phase transition in 2H-TaS<sub>2</sub>at 75 K

J. P. Tidman, O. Singh, A.E. Curzon et al. · Philosophical magazine · 1974 · 109 citations

, , +14

Localization in the metallic regime of granular Cu—SiO2 films

N. Savvides, S. P. McAlister, C. M. Hurd et al. · Solid State Communications · 1982 · 37 citations

, , +10