Applied Physics Letters · 1994 · 95 citations · 4 references
Optical MaterialsEngineeringMeasurementOptical TestingLaser ApplicationsOptical MetrologyEducationOptical CharacterizationBeam OpticGraphical MethodOptical PropertiesInstrumentationOptical SystemsOptical SpectroscopyPhotonicsRadiation DetectionPhysicsZ-scan MeasurementNon-linear OpticLaser Beam PropagationClassical OpticsZ-scan MeasurementsNonlinear CrystalsLiquid Crystal 5CbInstrument ScienceOptical PhysicApplied PhysicsOptical System Analysis
Z-scan measurements of third-order optical nonlinearities are usually carried out with Gaussian beams. Good quality Gaussian beams are not readily available, however, and to overcome this limitation, we analyze the Z-scan experiment using top-hat beams. A graphical method is developed which allows straightforward determination of the nonlinear refraction and absorption coefficients from experimental data. The advantage of using top-hat beams is that it allows Z-scan measurements using a wide variety of laser sources, including dye lasers. χ(3) values obtained using Z-scan measurements with top-hat and Gaussian beams are compared for the liquid crystal 5CB (4-cyano-4′-n-pentybiphenyl).
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Mansoor Sheik‐Bahae, A. A. Said, Eric W. Van Stryland · Optics Letters · 1989 · 2.6K citations
<i>Z</i>-scan technique using top-hat beams
Wenzhi Zhao, Peter Palffy‐Muhoray · Applied Physics Letters · 1993 · 184 citations