Applied Physics Letters · 1998 · 35 citations · 21 references
EngineeringMicroscopyTunneling MicroscopyMicroscopy MethodOptical DiagnosticsOptical PropertiesElectron SpectroscopyCutoff AnomaliesLight MicroscopyOptical SpectroscopyApplied Bias VoltagePhotonicsPhotoluminescencePhysicsNatural SciencesSpectroscopyScanning Probe MicroscopyApplied PhysicsBias VoltageOptoelectronicsLight Emission
Light emission from noble metal tunneling junctions of a scanning tunneling microscope has been detected in air. A spectroscopic study of the photons emitted from Au/Au and PtIr/Au junctions has been performed as a function of the applied bias voltage. A higher-energy emission band, which grows in as a function of bias voltage, has been observed in the recorded spectra. The high energy cutoffs of the recorded spectra do not follow the quantum law hνcutoff=eVsample.
21
Light Emission from Inelastic Electron Tunneling
John Lambe, S. L. McCarthy · Physical Review Letters · 1976 · 495 citations
Photon emission with the scanning tunneling microscope
James K. Gimzewski, B. Reihl, J. H. Coombs et al. · The European Physical Journal B · 1988 · 272 citations