Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films

J. G. Bergman, D. S. Chemla, P. F. Liao, A. M. Glass, A. Pinczuk, R. M. Hart, David H. Olson

Optics Letters · 1981 · 86 citations · 21 references

Concepts

Abstract

By using an evaporated silver film that has a continuously varying thickness, we have demonstrated the dependence of surface-enhanced Raman scattering (SERS) on the dielectric properties of the film. These results support local field models that are based on metal-particle resonances for SERS.

References

21