Concepedia
Thin Solid Films · 1981 · 23 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials ChemistryThin FilmsAuger Electron SpectroscopyMetalsThin-film MaterialsAlloyingAuger Line Shape AnalysisAuger Parameter AnalysisLayered Transition Metal OxidesPeak Shape Analysis
3
An Auger analysis of the SiO2-Si interface
J. S. Johannessen, W. E. Spicer, Y. E. Strausser · Journal of Applied Physics · 1976 · 260 citations
Natural Sciences, Chemistry, Materials Science +16
Linearized secondary-electron cascades from the surfaces of metals. I. Clean surfaces of homogeneous specimens
E. N. Sickafus · Physical review. B, Solid state · 1977 · 181 citations
Natural Sciences, Materials Science, Physics +16
Linearized secondary-electron cascades from the surfaces of metals. II. Surface and subsurface sources
E. N. Sickafus · Physical review. B, Solid state · 1977 · 94 citations