Journal of Applied Physics · 1966 · 84 citations · 3 references
Natural SciencesMaterials SciencePhysicsOptical MaterialsOpticsThin FilmsOptical Properties Of MaterialsOptical Properties Of SolidsOptical SpectroscopyOptical Thin FilmsRefractive IndexThin Film Optical PropertiesOptical CharacterizationOptical ConstantsOptical PropertiesReflectanceSize EffectsThickness-dependent Optical PropertiesThin-film Optical CharacterizationWavelength Dependence
The transmittance and reflectance of CuO0.67 and CuO films ranging in thickness from 392 to 2335 Å have been measured in the wavelength region of 400 to 800 mμ. These data were used to obtain the wavelength dependence of the optical constants of these materials. Differences between the optical properties of CuO0.67 and Cu2O are attributed to differences in stoichiometry rather than to size effects. A method for measuring absolute reflectance is described.
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Optical Properties of Nickel Oxide
Roger H. Newman, R. M. Chrenko · Physical Review · 1959 · 520 citations
D. P. Snowden, Howard Saltsburg · Physical Review Letters · 1965 · 66 citations