Electronics Letters · 1995 · 34 citations · 2 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice ReliabilityDevice ScalingSemiconductor PhysicsSemiconductor ReliabilityShort-channel EffectsCarrier GenerationDevice Scaling EffectsElectron-electron InteractionsHot Carrier DynamicsHot Carrier EffectsHot Carrier GenerationHot Carrier InjectionScaling Effects In Cmos
Results are presented which suggest that as device dimensions are scaled down, hot carrier reliability problems may re-emerge despite reductions in supply voltage. This conclusion is drawn from theoretical results which show an increasingly important role played by electron-electron interactions as device dimensions are reduced.
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