Concepedia

Determination of trace element impurities in ultrapure reagents by total reflection X-ray spectrometry

Andreas Prange, K. Kramer, U. Reus

Spectrochimica Acta Part B Atomic Spectroscopy · 1991 · 28 citations · 2 references

Concepts

PharmacyChemical EngineeringChemistryAnalytical ChemistryElemental AnalysisSpectroscopyElemental Composition AnalysisElemental ImpuritiesImpurity QuantificationTrace Element AnalysisTrace Element ChemistryX-ray SpectroscopyElemental Impurity AnalysisElemental Impurity QuantificationReagent Purity ControlReagent-derived ImpuritiesTrace Element ImpuritiesUltra-trace Element AnalysisUltra-trace Element Determination

References

2

Inductively coupled plasma mass spectrometric analysis of ultrapure acids

Paul J. Paulsen, Ellyn S. Beary, Diane S. Bushee et al. · Analytical Chemistry · 1988 · 82 citations

Natural Sciences, Chemistry, Analytical Chemistry +4

Ultra-trace analysis of metallic contaminations on silicon wafer surfaces by vapour phase decomposition/total reflection X-ray fluorescence (VPD/TXRF)

Christian Neumann, P. Eichinger · Spectrochimica Acta Part B Atomic Spectroscopy · 1991 · 80 citations

Natural Sciences, Materials Engineering, Materials Science +16