Journal of Physics Conference Series · 2014 · 13 citations · 2 references
X-ray SpectroscopyEngineeringAbsorption SpectroscopyPolycapillary OpticsChemistryX-ray FluorescenceX-ray ImagingAnalytical ChemistryAcoustic MonochromatorElemental AnalysisInstrumentationElemental CharacterizationRadiologyHealth SciencesMaterials ScienceMethod SensitivityUltrasoundSynchrotron RadiationSpectroscopyX-ray DiffractionX-ray Elemental AnalysisX-ray Optic
The method for X-ray elemental analysis and the device for its realization, based on the X-ray absorption spectroscopy technique, are proposed. Estimations of the method sensitivity have been carried out by means of numerical simulation. The simulation results indicate that the sensitivity of the proposed method for elemental analysis is not less than 10−4.
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