<i>q</i>-Dependence of Electron Capture Cross Sections for Slow Kr^<i>q+</i>and Xe^<i>q+</i>Ions on H₂and He

Abstract

Krq+ (2 ⩽ q ⩽ 9) and Xeq+ (2 ⩽ q ⩽ 10) ions extracted from an "ion-impact ion source" are arranged to make charge transfer collisions on H2 and He at 0.29 keV amu-1, and the single- and double-electron capture cross-sections are measured as a function of q. An improved MCP-PSD device is applied to analyze charge fractions of collided projectiles. The cross-sections for single-electron capture are compared with the known empirical and theoretical treatments, while those for double-electron capture cannot be fitted to any existing models.